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SWTest is Coming Together to Reimagine, Reinvent, and Reconnect

After several months of uncertainty surrounding the Covid-19 global pandemic, we’ve decided we’re not waiting, we’re creating… a virtual conference environment to bring everyone together in 2020. The annual SWTest Conference is the only industry conference that focuses on all aspects of semiconductor wafer and die level probe testing.

On November 11th, we’re going to Communicate, Collaborate and Celebrate!

SWTest Unthethered 2020 will be a one-day virtual Conference and Expo featuring two Keynote Speakers, one in the AM and one in the PM; seven technical sessions with live Q&A; an interactive Expo with live chat, swag giveaways, a scavenger hunt, a happy hour with an “engagement trivia challenge” with great prizes and ON DEMAND Access 24/7 from November 12 – December 3, 2020.

Registration Options:

Full Conference Registration
Includes all conference activities: Two Keynote Addresses, Seven Technical Sessions with live Q&A, Interactive Expo Hours with Scavenger Hunt, Soft-Opening with Swag Giveaways, Happy Hour with Swag Giveaways, Trivia Challenge, 24/7 ON DEMAND 
Access from November 12 – December 3, 2020

Early Bird:   $180 prior to October 12th 2020 (use promotional code SWTEST2020 when prompted)
$225 after October 12th 2020
 
Expo Only Registration
Includes all conference activities EXCEPT access to Keynotes and Technical Sessions
 
Early Bird:   $40 prior to October 12th 2020 (use promotional code SWTEST2020 when prompted)
$50 after October 12th 2020
 
Student Registration
Includes all conference activities: Two Keynote Addresses, Seven Technical Sessions with live Q&A, Interactive Expo Hours, Soft-Opening with Swag Giveaways, Happy Hour with Swag Giveaways, 
Trivia Challenge, 24/7 ON DEMAND Access from November 12 – December 3, 2020

(Students must provide a picture of a valid student ID and email it to:  alice@cemamerica.com)


Early Bird:   $80 prior to October 12th 2020 (use promotional code SWTEST2020 when prompted)
$100 after October 12th 2020
 
ON DEMAND Only Registration
Includes Two Keynote Addresses, Seven Technical Sessions with live Q&A, Interactive Expo
$150 from November 12th – December 3rd, 24 hours a day/7 days a week

Sessions




Keynote Address #1 - Moore’s Law and the Future of Test

Presented by: Pooya Tadayon, Ph.D., Intel Fellow



Test Challenges and Solutions for Testing Wi-Fi 6E, UWB and 5G NR IF Devices in the 3-12 GHz Range

Presented by: Jeorge  Hurtarte Ph.D., Teradyne, Inc.
Session 1 Chair: Geert Gouwy






Morning Break - Please visit the Exhibition Hall!

Presented by: Jerry Broz, Ph.D., SWTest General Chair


Opto-electronical probe card for high-volume wafer level test of photonic integrated circuits

Presented by: Tobias Gnausch, Jenoptik, AG
Session 2 Chair: Karen Armendariz







Lunch Break - Please visit the Exhibition Hall!

Presented by: Jerry Broz, Ph.D., SWTest General Chair



Keynote Address #2 - Probe in the Spotlight

Presented by: Michael D. Slessor, Ph.D., FormFactor, Inc.



Afternoon Break - Please visit the Exhibition Hall!

Presented by: Jerry Broz, Ph.D., SWTest General Chair


High-speed PCB electrical characterization with good stability and repeatability

Presented by: Adolph Cheng, MPI Corporation
and Steven Wu, MPI Corporation
Session 3 Chair: Patrick Mui



Innovative strategies for improved test measurements using Kelvin contacts with a Flying prober

Presented by: Alessandro Antonioli, Technoprobe S.p.A.
and Sebastiano Grimaldi, STMicroelectronics
Session 3 Chair: Patrick Mui




Social Hour - Scavenger Hunt - Trivia Contest - Fun!

Presented by: Jerry Broz, Ph.D., SWTest General Chair


SWTest Untethered 2020

 
 
 
 
 
 
 
 
 
 
 
 
 
 



 
 
 
 
 
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