and Sebastiano Grimaldi, STMicroelectronics

Studies in electronic with specialization in electrical testing of power devices at wafer level and package level. Sebastiano has 36 years of experience in semiconductor electronics world. Today EWS Operations Manager in STMicroelectronics. He has also covered, among 36 years in STM, most of the Wafer manufacturing process steps starting from Epitaxy growth until the final test of the packaged device.


Extending burn-in test at full wafer level to reduce overall cost of test at HVM
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Innovative strategies for improved test measurements using Kelvin contacts with a Flying prober
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