Presented by: Alessandro Antonioli, Technoprobe S.p.A.

Graduated in Solid State Physics at Milan State University  with master thesis in Flash-Memories, Alessandro has 26 years of experience in semiconductor electronics world. Today Director Marketing and Business Development he has also covered sales at Technoprobe for Probe Card solution for semiconductor wafer sort testing for the past 6 years. He has a deep knowledge on semiconductor testing and product engineering as well as reliability, to IC’s applications. Started his carrier as engineering at STMicroelectronics, he moved to Field Application at IDT and Sales at LSI and Avago, gaining a wide knowledge of semiconductor market and applications.


Extending burn-in test at full wafer level to reduce overall cost of test at HVM
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Innovative strategies for improved test measurements using Kelvin contacts with a Flying prober
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