Karen is currently the President and CEO of Celadon System’s, The Home of Peace of Mind Probing, a US-based on-wafer probing solutions provider focused on the design and manufacturing of advanced probe card solutions. Karen has worked in the semiconductor industry for 25 years holding various leadership roles in engineering, manufacturing, sales, and marketing. She started at Intel Corporation then on to National Semiconductor, where she was responsible for managing a backend microprocessor test floor. For over 20 years, Karen has worked with a variety of probe cards and probe card technologies. Karen has authored several forward-thinking publications relevant to on-wafer probing solutions. Karen holds a bachelor’s degree in Electrical Engineering from the University of Oklahoma as well as an MBA from Oklahoma City University.a
Sessions
SWT Crew
Opto-electronical probe card for high-volume wafer level test of photonic integrated circuits
Extending burn-in test at full wafer level to reduce overall cost of test at HVM
Challenges of Trench Probing