Presented by: Tobias Gnausch, Jenoptik, AG

Tobias Gnausch is Product Manager for Test & Measurement in the Strategic Business Unit “Semiconductor & Advanced Manufacturing” of Jenoptik. He received his diploma in Technical Physics from the University of Jena in 2005, with the specialization on wave-optical design. Following his diploma, Tobias worked as a mechanical engineer and hardware developer for interferometric stylus measurement systems at BOSCH, Stuttgart. He also gained experience in stray light measurements and designing DUV-goniometer for this type of measurements.


Opto-electronical probe card for high-volume wafer level test of photonic integrated circuits
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